Low Voltage Communications SPDs
Institute of Electrical and Electronics Engineers, Inc. (IEEE) and American National Standards Institute (ANSI) standards, guides, and recommended practices regarding low voltage surge protective devices(spds).
IEEE Std C62.64 TM -1997 IEEE Standard Specifications for surge protectors Used in Low-Voltage Data, Communications, and Signaling
This standard applies to power surge arresters for application on multiconductor and coaxial, balanced or unbalanced, data, communications, and signaling circuits with voltages less than or equal to 1000 V rms, or 1200 V dc. These surge protectors are intended to limit voltage surges, current surges, or both. You will receive an email from Customer Service with the URL needed to access this publication online.
WG 3.6.7
IEEE Std C62.43 TM -1999 IEEE Guide for the Application of surge protection device Used in Low-Voltage (Equal to or less than 1000 V rms or 1200 Vdc) Data, Communications, and Signaling Circuits
Assistance is provided for the selection of the most appropriate type of low-voltage data, communications, and/or signalling circuit surge protector for a particular application or set of conditions. surge arresters functions and characteristics are also explained and evaluated. AC power circuit applications are not addressed in this document.
WG 3.6.7
IEEE Std C62.36 TM -2000 Standard Test Methods for surge protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Methods are established for testing and measuring the characteristics of photovoltaic surge protection device used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 Vdc. The dc surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction photovoltaic surge arresters are not covered, nor are test methods for low-voltage power circuit applications.
WG 3.6.7
IEEE Std C62.38 TM -1994 IEEE Guide on Electrostatic Discharge (EDS): ESD Withstand Capability Evaluation Methods (for Electronic Equipment Subassemblies)
This guide establishes test methods for the evaluation of ESD withstand capability for electronic equipment subassemblies. It includes information about test conditions, test equipment, and test procedures for ESD tests of printed circuit boards and other subassemblies.
Keywords: Climate and electromagnetic conditions; test methods; test criteria and reports; and performance specifications for ESD simulation equipment.